Introduction:

  With our new ci220, engineers have access to complete test coverage and comprehensive debugging options, providing the user with a head start to meet their quality and time to market targets.。It is a state-of-the-art contact interface test tool built around a fast signal generation and acquisition system interfacing to the smart card via carefully designed analog circuitry. It's integrated FPGA combines precise real-time processing of the analogue signals with repeatable cycle-accurate execution of the digital protocol.

  The ci220’s arbitrary waveform generator capabilities and analogue circuitry provide full control over electrical signal parameters such as VCC, signal high and low voltages, rise and fall times, clock frequency, and duty cycle. This enables the ci220 to address compliance and certification testing as easily as chip validation.

The ci220’s electrical and protocol processing power is channeled through its user interface which continues the ci230’s focus on test execution performance and usability. Follow EMV contact L1 Analog and Digital latest test spec EMV Contact Interface Specification V1.0 Oct. 2022，test cases ,include

EMV_Card_L1_Electrical_Test Cases_v10a_20231215 Dec. 2023

EMVCo_Card_L1_Protocol_Test Cases_v10a_20231215 Dec. 2023

Application Scenario     EMV Payment      SIM & eSIM      Smart Card      Certification testing      Development / Debugging      Customermize design

Supported Standard     EMV Contact L1      ISO 7816      ETSI TS 102 221