• ci230 – High Speed NFC Tester
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ci230 is the next generation of a fully integrated NFC test system. It includes a high-speed RF signal generation and analysis unit that reduces test times to an absolute minimum. Using the example of EMVCo PCD digital, a full run of all 600+ test cases takes less than 10 minutes, depending on the DUT.

In addition, it has an integrated Power Amplifier and allows direct connection to all standard antennas. It can deliver up to 10 W continuous power.

USB and Ethernet interface allow easy connection to a remote host. An additional trigger I/O and GPIO ports provide simple connection to external devices. A complete set of test suites provide standard test coverage for the available standards listed below as well as user-configurable analog and digital test cases. Due to its high integration and excellent form factor, ci230 is a perfect fit for any kind of development and test purpose in the NFC environment.

ci230 fits easily on any desk, is portable and can be carried as hand luggage in airplanes.